The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2016
Filed:
Mar. 14, 2013
Applicant:
Emc Corporation, Hopkinton, MA (US);
Inventors:
Hung Hing Anthony Pang, San Jose, CA (US);
Fabiano Botelho, Sunnyvale, CA (US);
Dhanabal Ekambaram, Milpitas, CA (US);
Nitin Garg, Sunnyvale, CA (US);
Assignee:
EMC Corporation, Hopkinton, MA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/00 (2006.01); G06F 17/30 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30215 (2013.01); G06F 3/064 (2013.01);
Abstract
Opportunistic repair of fragmentation in a synthetic backup is disclosed. In various embodiments, data generated to perform processing other than fragmentation repair is received. At least a portion of the received data is used to compute a locality measure with respect to a group of segments comprising a portion of a file. A decision whether to repair fragmentation of segments comprising the group is made based at least in part on the computed locality measure.