The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2016
Filed:
Dec. 31, 2012
China Unionpay Co., Ltd., Shanghai, CN;
Zhijun Lu, Shanghai, CN;
Lijun Zu, Shanghai, CN;
Xingjian Wang, Shanghai, CN;
Shuo He, Shanghai, CN;
Hua Cai, Shanghai, CN;
CHINA UNIONPAY CO., LTD., Shanghai, CN;
Abstract
The present invention proposes an information interaction testing device and method based on the associated testing case automatic generation. The associated testing case generation module in said device may automatically generate the associated testing case files corresponding to all associated information interactions which can be triggered by said reference information interaction based on the reference information interaction and the predefined rules determined by the application type provided by the system under test. The information interaction testing device and method based on the associated testing case automatic generation disclosed in the present invention have the higher testing speed and the higher testing usability as well as are low-cost.