The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2016

Filed:

Mar. 16, 2012
Applicants:

Marcel Mitran, Markham, CA;

Chung-ling K. Shum, Wappingers Falls, NY (US);

Kevin A. Stoodley, Richmond Hill, CA;

Inventors:

Marcel Mitran, Markham, CA;

Chung-Ling K. Shum, Wappingers Falls, NY (US);

Kevin A. Stoodley, Richmond Hill, CA;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 9/30 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 9/30145 (2013.01); G06F 9/30058 (2013.01); G06F 11/3644 (2013.01);
Abstract

Embodiments of the invention relate to performing run-time instrumentation. Run-time instrumentation is captured, by a processor, based on an instruction stream of instructions of an application program executing on the processor. The capturing includes storing the run-time instrumentation data in a collection buffer of the processor. A run-time instrumentation sample point trigger is detected by the processor. Contents of the collection buffer are copied into a program buffer as a reporting group based on detecting the run-time instrumentation sample point trigger. The program buffer is located in main storage in an address space that is accessible by the application program.


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