The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2016

Filed:

Jun. 12, 2015
Applicant:

Kyocera Document Solutions Inc., Osaka-shi, Osaka, JP;

Inventor:

Naohiro Anan, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02P 6/06 (2006.01); H02P 23/22 (2016.01); G03G 15/00 (2006.01); H02P 29/00 (2016.01); H02K 29/14 (2006.01); H02P 23/00 (2016.01);
U.S. Cl.
CPC ...
G03G 15/757 (2013.01); H02K 29/14 (2013.01); H02P 6/06 (2013.01); H02P 23/0077 (2013.01); H02P 23/16 (2016.02); H02P 23/22 (2016.02); H02P 29/00 (2013.01);
Abstract

A target cycle recording portion () records target cycle data (Tref) into a first ring buffer () each time a reference pulse signal (Ps) is generated, thereby recording the target cycle data (Tref) sequentially into the first ring buffer (). A measured cycle recording portion () records measured cycle data (Tenc) into a second ring buffer () each time an encoder pulse signal (Pe) is generated, thereby recording the measured cycle data (Tenc) sequentially into the second ring buffer (). A phase error calculating portion () calculates a phase error PHE by integrating a difference between the target cycle data (Tref) and the measured cycle data (Tenc) that are sequentially recorded in data buffers respectively in correspondence with each other in the two ring buffers.


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