The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2016

Filed:

Feb. 18, 2014
Applicant:

Gs Yuasa International Ltd., Kyoto, JP;

Inventors:

Eiji Hayashi, Kyoto, JP;

Masashi Nakamura, Kyoto, JP;

Assignee:

GS YUASA INTERNATIONAL LTD., Kyoto-Shi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02J 7/00 (2006.01); H02J 7/04 (2006.01); G01R 31/36 (2006.01); H01M 10/48 (2006.01); B60L 11/18 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3624 (2013.01); G01R 31/361 (2013.01); H01M 10/48 (2013.01); B60L 11/1861 (2013.01); G01R 31/3648 (2013.01); H01M 10/486 (2013.01); H02J 7/0013 (2013.01); H02J 7/0016 (2013.01); H02J 7/0047 (2013.01);
Abstract

A state of charge estimation device for estimating a state of charge of an electric storage device includes a voltage measurement component, a current measurement component, and a controller component. The controller component is configured to, when estimation of state of charge of the electric storage device based on an accumulated amount of currents measured by the current measurement component is defined as a current accumulation method and the estimation based on an open circuit voltage (OCV) of the electric storage device measured by the voltage measurement component is defined as an OCV method, permit estimation of state of charge by the OCV method when a condition that an error in estimation of state of charge of the electric storage device by the current accumulation method exceeds an error in estimation of state of charge of the electric storage device by the OCV method is satisfied.


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