The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2016
Filed:
Jan. 22, 2015
Applicant:
Olympus Corporation, Shibuya-ku, Tokyo, JP;
Inventors:
Nobuaki Sakai, Hachioji, JP;
Yoshitsugu Uekusa, Tachikawa, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 20/02 (2010.01); G01Q 10/00 (2010.01); G01Q 30/14 (2010.01); G01Q 30/02 (2010.01);
U.S. Cl.
CPC ...
G01Q 10/00 (2013.01); G01Q 30/14 (2013.01); G01Q 20/02 (2013.01); G01Q 30/025 (2013.01);
Abstract
A scanning probe microscope to measure a sample set on a sample mount in liquid includes a scanning mechanism to scan a cantilever provided with a probe at a free end along an X-axis, a Y-axis, and a Z-axis perpendicular to each other, and a liquid contact member including an optical transmission portion to transmit detection light for detecting a displacement of the cantilever, and arranged at least partially in contact with the liquid. The liquid contact member is not scanned by the scanning mechanism.