The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2016

Filed:

Mar. 12, 2012
Applicants:

Yutaka Ikeda, Kakogawa, JP;

Noriyuki Nakanishi, Kakogawa, JP;

Inventors:

Yutaka Ikeda, Kakogawa, JP;

Noriyuki Nakanishi, Kakogawa, JP;

Assignee:

SYSMEX CORPORATION, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 27/00 (2006.01); G01N 33/50 (2006.01); G01N 1/38 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00663 (2013.01); G01N 35/00613 (2013.01); G01N 35/00712 (2013.01); G01N 2035/00673 (2013.01); Y10T 436/12 (2015.01); Y10T 436/25 (2015.01);
Abstract

The present invention is a reagent preparation apparatus, comprising: a reagent preparation unit configured to prepare a reagent for processing a sample; a measuring unit configured to measure a property of the reagent prepared by the reagent preparation unit; a waste section configured to discard the prepared reagent when a measurement result by the measuring unit does not meet a predetermined condition; and a controller configured to control a reagent preparation operation of the reagent preparation unit, wherein the controller controls the reagent preparation unit to stop the reagent preparation operation when a number of times of discarding a reagent has reached a predetermined plurality of times.


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