The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2016

Filed:

Jul. 18, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Yuichi Naito, Yokohama, JP;

Kanako Dowaki, Tokyo, JP;

Kazumasa Matsumoto, Yokohama, JP;

Takashi Yamazaki, Asaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01); H04N 5/32 (2006.01); A61B 6/00 (2006.01); H04N 5/361 (2011.01); H04N 5/363 (2011.01); H04N 5/365 (2011.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); A61B 6/5258 (2013.01); H04N 5/32 (2013.01); H04N 5/361 (2013.01); H04N 5/363 (2013.01); H04N 5/3655 (2013.01);
Abstract

An imaging apparatus determines, based on a frame interval associated with imaging of the object, the number of output values to be measured, and inputs electric signals of a given value to amplifiers to measure the determined number of output values during a time after a readout circuit performs a readout operation for the photoelectric conversion elements of one line and before the readout circuit performs a readout operation for the photoelectric conversion elements of the next one line, calculates a difference between the measured output value and a predetermined reference value, and corrects a measurement value of one line of the object by increasing or decreasing the measurement value by the difference.


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