The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2016
Filed:
May. 14, 2014
Applicant:
Nippon Steel & Sumitomo Metal Corporation, Tokyo, JP;
Inventors:
Assignee:
NIPPON STEEL & SUMITOMO METAL CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); B21C 51/00 (2006.01); G01B 11/30 (2006.01); B21B 38/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/25 (2013.01); B21C 51/00 (2013.01); G01B 11/2522 (2013.01); G01B 11/306 (2013.01); B21B 38/00 (2013.01);
Abstract
A method for measuring flatness of a sheet includes acquiring a pattern image by projecting a light and dark pattern composed of light portions and dark portions onto a surface of the sheet, which is traveling between adjacent rolling stands, from a projection unit situated between the rolling stands, and capturing an image of the light and dark pattern with an image capture unit situated between the rolling stands, and measuring the flatness by analyzing the acquired pattern image. Arrangement parameters L, α, β, hc and hp satisfy the following mathematical expression (1).