The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2016

Filed:

Feb. 09, 2015
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Ute Feuerlein, Erlangen, DE;

Christiane Koch, Eggolsheim, DE;

Rainer Raupach, Heroldsbach, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); G21K 3/00 (2006.01); A61B 6/00 (2006.01); A61B 6/06 (2006.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4035 (2013.01); A61B 6/032 (2013.01); A61B 6/06 (2013.01); A61B 6/467 (2013.01); A61B 6/542 (2013.01); A61B 6/544 (2013.01); A61B 6/545 (2013.01); A61B 6/0407 (2013.01);
Abstract

A method is disclosed for selecting a radiation form, to change spatial distribution of the intensity and/or the spectrum of x-ray radiation of an x-ray source of an imaging system including a plurality of radiation form filters. The method includes acquiring a plurality of radiation absorption profiles of an examination object, of which image data is to be generated with the aid of the imaging system, in parallel with the patient axis from various directions; calculating an effective radiation absorption profile by averaging the recorded radiation absorption profiles; and selecting the radiation form filter on the basis of the effective radiation absorption profile of the examination object from a plurality of radiation form filters. An x-ray imaging system is further disclosed.


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