The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2016
Filed:
Jan. 05, 2012
Senthil Kumar, Singapore, SG;
Md. Irwan Bin Md. Kassim, Singapore, SG;
Kittipong Kasamsook, Singapore, SG;
Mohamad Sulhede Bin Samsudin, Singapore, SG;
Visit Thaveeprungsriporn, Singapore, SG;
Senthil Kumar, Singapore, SG;
Md. Irwan bin Md. Kassim, Singapore, SG;
Kittipong Kasamsook, Singapore, SG;
Mohamad Sulhede Bin Samsudin, Singapore, SG;
Visit Thaveeprungsriporn, Singapore, SG;
NITTO DENKO CORPORATION, Osaka, JP;
Abstract
A device and method for removal of ambient noise signal from a photoplethysmographic measurement is provided. The method comprises obtaining a first signal waveform based on detecting light based on a first light illumination; obtaining a second signal waveform based on detecting light based on a second light illumination; tuning the first light and second light illumination such that the maximum amplitudes of the first and second signal waveforms are maximized and within a predetermined saturation range, such that ambient light interference for the first and second signal waveforms is reduced; obtaining a third signal waveform based on detecting ambient light; obtaining respective maximum and minimum values of the first and the second signal waveforms; and deriving signal values of the first and second signal waveforms with the removal of ambient noise by subtracting AC and DC average values of the third signal waveform from the first and second signals.