The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2016
Filed:
Nov. 26, 2014
Nidek Co., Ltd., Gamagori, Aichi, JP;
Michihiro Takii, Aichi, JP;
Noriji Kawai, Aichi, JP;
NIDEK CO., LTD., Aichi, JP;
Abstract
There is provided an ophthalmic measurement apparatusincluding: a keratoscopic projection optical systemthat projects a pattern target toward a cornea Ec of a subject eye E; and an imaging optical system, the imaging deviceof which captures second Purkinje images Rpand Rpthat are target images formed due to the pattern target being reflected from a posterior corneal surface of the subject eye E. In the ophthalmic apparatus, a controllerexecutes a process (S) of detecting the second Purkinje images Rpand Rpbased on an imaging signal output from the imaging device, and an anterior chamber information acquisition process (S) of acquiring information of the posterior corneal surface of the subject eye E based on the detected result of the detecting process.