The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2016

Filed:

Mar. 25, 2016
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventor:

Jun Taek Park, Seoul, KR;

Assignee:

SK Hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8234 (2006.01); H01L 29/10 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 29/423 (2006.01);
U.S. Cl.
CPC ...
H01L 29/1083 (2013.01); H01L 21/823431 (2013.01); H01L 29/42376 (2013.01); H01L 29/66795 (2013.01); H01L 29/7853 (2013.01);
Abstract

A semiconductor device includes a fin-shaped active region protruding from a surface of a base substrate. The fin-shaped active region includes a first impurity region and a second impurity region spaced apart from each other along a first direction and a channel region disposed between the first and second impurity regions. A trench is provided in the base substrate under the channel region. The trench extends in a second direction to intersect the fin-shaped active region in a plan view. A blocking layer fills the trench to overlap with the channel region of the fin-shaped active region. A gate is disposed to overlap with blocking layer and the channel region.


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