The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2016
Filed:
Jan. 04, 2012
Peter Forthmann, Sandesneben, DE;
Thomas Koehler, Norderstedt, DE;
Peter Forthmann, Sandesneben, DE;
Thomas Koehler, Norderstedt, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The invention relates to an imaging system for imaging an object. Projection data of the object are acquired by using a radiation source emitting primary radiation () from a primary focal spot () and unwanted secondary radiation () from secondary focal spots (). A first image of the object is reconstructed from the acquired projection data, a forward projection of the secondary radiation through the first image is simulated for generating secondary projection data, and a second image is generated based on the acquired projection data and the secondary projection data. Since the secondary projection data, which can generally cause image artifacts, are determined, the reconstruction unit can consider these unwanted secondary projection data while reconstructing the second image, in order to reduce the influence of the secondary projection data on the reconstructed second image, thereby improving the image quality.