The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2016
Filed:
Sep. 10, 2014
Siemens Aktiengesellschaft, Munich, DE;
Annemarie Hausotte, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method is disclosed for evaluating an examination of an examination object using a medical imaging device by way of an evaluation unit. The method includes reading in an examination data set of the examination object; assigning a reference data set to the read-in examination data set, the reference data set comprising at least one reference region; selecting at least one reference region; assigning at least one examination region of the examination data set to the at least one reference region; and marking the at least one examination region in at least one image of the examination data set. In an advantageous embodiment, the marking of the at least one examination region includes a marking tolerance and a segmentation of the at least one examination region on at least one image of the examination data set, and the segmentation depends on the medical imaging device.
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