The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2016
Filed:
Nov. 26, 2014
Canon Kabushiki Kaisha, Tokyo, JP;
Yusuke Yachide, St Leonards, AU;
Haris Javaid, Kensington, AU;
Sridevan Parameswaran, Kensington, AU;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
A method of determining a metric of a System-on-Chip (SoC), the method comprising: receiving a model dependency graph representing the SoC, the model dependency graph having a plurality of nodes representing components of the SoC and their models, and a plurality of directed edges between the nodes representing variables passed between the nodes of the model dependency graph; modifying the model dependency graph by clustering a plurality of strongly connected nodes in the model dependency graph into a single clustered node to form a clustered model dependency graph; determining an execution schedule according to a direction of an edge in the clustered model dependency graph; and executing models in the clustered model dependency graph according to the execution schedule to determine metrics of the SoC.