The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2016

Filed:

Jul. 07, 2014
Applicants:

Edward-robert Tyercha, Heidelberg, DE;

Gerrit Simon Kazmaier, Heidelberg, DE;

Hinnerk Gildhoff, Heidelberg, DE;

Isil Pekel, Heidelberg, DE;

Lars Volker, Karlsruhe, DE;

Tim Grouisborn, Mannheim, DE;

Inventors:

Edward-Robert Tyercha, Heidelberg, DE;

Gerrit Simon Kazmaier, Heidelberg, DE;

Hinnerk Gildhoff, Heidelberg, DE;

Isil Pekel, Heidelberg, DE;

Lars Volker, Karlsruhe, DE;

Tim Grouisborn, Mannheim, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30601 (2013.01); G06F 17/30312 (2013.01); G06F 17/30321 (2013.01); G06F 17/30539 (2013.01); G06F 17/30946 (2013.01);
Abstract

Cluster analysis of data points in a data set can be optimized by identification of a preferred cluster analysis method. This identification can be based on indexing the data using a Hilbert curve and determining whether the data points are predominantly in spherical or non-spherical clusters. Methods, systems, and articles of manufacture are described.


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