The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2016
Filed:
Mar. 12, 2014
National Instruments Corporation, Austin, TX (US);
Daniel J. Baker, Cary, NC (US);
NATIONAL INSTRUMENTS CORPORATION, Austin, TX (US);
Abstract
Power leveling a system under test (SUT). An input signal is provided at an initial power level to the SUT. Multiple iterations are performed, each including measuring, over a specified measuring interval, power of a signal produced by the SUT in response to the input signal, and dynamically adjusting the power of the input signal in response. The measuring interval is increased over the iterations, thereby increasing accuracy of the measuring over the iterations while converging the signal to a specified power level. An initial power leveling operation may be performed for the SUT to establish a specified power level, after which the SUT is tested, during which multiple power leveling operations are performed, each including measuring power of a signal from the SUT over a specified measuring interval, and adjusting the input signal in response, thereby maintaining the specified power level during the testing while correcting for thermal droop.