The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2016
Filed:
Jan. 15, 2015
Apple Inc., Cupertino, CA (US);
Robert E. Jeter, Santa Clara, CA (US);
Neeraj Parik, San Jose, CA (US);
Sukalpa Biswas, Fremont, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A method and apparatus for calibration of a clock signal used in data transmission is disclosed. The method includes a calibration having coarse and fine grain procedures. The coarse grain procedure begins from the center of a current eye and performs reads while decrementing the delay provided to the clock signal until at least one bit fails. This is repeated, from the center of the eye, incrementing until again at least one bit fails. The lower and upper last passing points are recorded. A fine grain procedure includes performing reads while decrementing, from the lower last passing point, recording points at which each bit fails until all fail. The fine grain procedure further includes incrementing, from the upper last passing point, recording points at which each bit fails until fail. Thereafter, a clock delay corresponding to the center of the new eye is determined based on the calibration data.