The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2016
Filed:
Aug. 26, 2013
Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Paul A. Zank, Brookline, NH (US);
David H. Herlihy, Nashua, NH (US);
Eldon M. Sutphin, Merrimack, NH (US);
Roland A. Gilbert, Milford, NH (US);
Paul E. Gili, Mason, NH (US);
BAE Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Abstract
A system and method for detecting at least one material under test (MUT) is presented. A Nuclear Quadrupole Resonance (NQR) measurement system includes a waveform generator configured to generate a continuous wave (CW) input signal comprising one or more frequencies. An RF shielded chamber receives the at least one MUT that is carried by a person walking through the chamber. A probe within the chamber illuminates the MUT with the CW signal and simultaneously receives possible NQR emissions from the at least one MUT. A bridge circuit is utilized to cancel the strong excitation CW signal from the generator which would otherwise mask the weak NQR emissions from the MUT that are received and detected by the measurement system. A detector can then detect the MUT based, at least in part, on the resonance signal.