The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2016

Filed:

Sep. 05, 2014
Applicant:

Novachips Canada Inc., Ottawa, CA;

Inventors:

Hong Beom Pyeon, Ottawa, CA;

Young-Goan Kim, Seongnam-si, KR;

Assignee:

Novachips Canada Inc., Ottawa, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G01R 31/317 (2006.01); G01R 31/3181 (2006.01); G11C 29/12 (2006.01); G11C 29/56 (2006.01); G11C 16/00 (2006.01); G11C 29/26 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31713 (2013.01); G01R 31/31701 (2013.01); G01R 31/31813 (2013.01); G11C 29/1201 (2013.01); G11C 29/56 (2013.01); G11C 16/00 (2013.01); G11C 2029/2602 (2013.01); G11C 2029/5602 (2013.01);
Abstract

An apparatus comprising a plurality of devices connected in series with one another, each of the devices comprising a test enable pin for receiving a test enable signal that indicates enablement of a test mode, and a test output pin for outputting a test output signal in the test mode, and a controller coupled to the devices and comprising an additional test output pin for outputting a test channel output signal, wherein a failure of at least one of the test output signals and the test channel output signal indicates the existence of one or more potential defects associated with the plurality of devices and the controller.


Find Patent Forward Citations

Loading…