The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2016
Filed:
Nov. 16, 2015
Triple Ring Technologies, Inc., Newark, CA (US);
Tobias Funk, Martinez, CA (US);
Triple Ring Technologies, Inc., Newark, CA (US);
Abstract
The present invention pertains to a system and method for X-ray imaging wherein a targeted fluence at the detector for projection images can be achieved at a plurality of projection angles around the imaging subject by control of exposure times implemented during image acquisition. Exposure time for a second projection image may be determined by the fluence in a first projection image, and in a third projection image by the fluence in a second projection image, where projection images are acquired within two degrees of one another. An acquisition parameter calculation can be configured to calculate acquisition parameters, such as said exposure times, to achieve the targeted fluence in projection images and can be coupled to a rotation controller that implements the acquisition parameters by controlling a relative angle between the imaging subject and X-ray image acquisition device.