The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2016
Filed:
Jan. 14, 2014
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Yusuke Tagawa, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
Initial values A^P^M^. . . A^P^M^of parameters representing a geometric relationship between an X-ray tube, a stage and a flat panel X-ray detector are estimated, a least squares solution (p^)of characteristic point three-dimensional coordinates is estimated, and only limited parameters are updated until reprojection square errors converge. Thus, based on known radiographic conditions, initial values of the parameters are estimated, and a nonlinear optimization operation is carried out on only the parameters considered, in view of mechanisms and drive characteristics of the apparatus, to have large errors between the initial values of the parameters and the parameters at a time when radiography is actually carried out. As a result, the calculation can be speeded up, while securing the convergence accuracy of the nonlinear optimization operation, by using the radiographic conditions, i.e. information on tomography.