The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2016

Filed:

Jun. 12, 2015
Applicant:

Shimadzu Corporation, Kyoto-shi, Kyoto, JP;

Inventors:

Shinji Tsuji, Kyoto, JP;

Hiroyuki Togo, Shiki, JP;

Assignee:

SHIMADZU CORPORATION, Kyoto-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/18 (2006.01); G01N 30/74 (2006.01); G01N 21/33 (2006.01);
U.S. Cl.
CPC ...
G01J 3/18 (2013.01); G01J 3/28 (2013.01); G01N 30/74 (2013.01); G01J 2003/2866 (2013.01); G01J 2003/2873 (2013.01); G01N 21/33 (2013.01);
Abstract

The wavelength of a spectrometer is calibrated by using a commercial Ho glass filter. The spectrometer includes a light source including a Dlamp and not including a mercury lamp, and a reference wavelength input unit for inputting, as a reference wavelength, a wavelength of a specific absorption peak separately measured for an Ho glass filter to be used. To calibrate the wavelength of the spectrometer by using the wavelength of a specific emission line peak of the Dlamp and the reference wavelength input by the reference wavelength input unit, the wavelength calibration unit holds a conversion table showing a theoretical relationship between the number of control pulses for rotating a diffraction element and the corresponding wavelength of diffracted light, and calibrates the number of control pulses from the conversion table by the wavelength calibration unit.


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