The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9476766 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 25, 2016

Filed:

Nov. 30, 2012
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventor:

Bernd Widzgowski, Dossenheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/44 (2006.01); G02B 21/00 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01); G01N 21/6408 (2013.01); G01N 21/6458 (2013.01); G02B 21/0076 (2013.01); G02B 21/0084 (2013.01);
Abstract

A method and an apparatus for examining a sample. The apparatus has a light source for generating excitation light in pulses which occur in succession at an excitation pulse frequency, for illuminating a sample region with the excitation pulse, and having a detector for detecting the detection light emanating from the sample region. The apparatus is characterized in that, for each detected photon of the detection light, the detector generates an electrical pulse and thereby a sequence of electrical pulses, and an analog-digital converter is provided that generates a digital data sequence by sampling the sequence of electrical pulses at a sampling rate.


Find Patent Forward Citations

Widzgowski, Bernd. (2016). Method and apparatus for examining a sample (U.S. Patent No. 9476766). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9476766

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