The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2016

Filed:

Mar. 05, 2015
Applicant:

General Photonics Corporation, Chino, CA (US);

Inventor:

Xiaotian Steve Yao, Diamond Bar, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/16 (2006.01); G01M 11/00 (2006.01); G01K 11/32 (2006.01);
U.S. Cl.
CPC ...
G01B 11/161 (2013.01); G01B 11/168 (2013.01); G01K 11/32 (2013.01); G01M 11/3109 (2013.01);
Abstract

Techniques and devices for measuring stress, strain, or temperature based on polarization crosstalk analysis in birefringence optical birefringent media including polarization maintaining fiber. The disclosed techniques and devices can be implemented to measure polarization crosstalk distribution in polarization maintaining fiber by placing the PM fiber in a 1-dimensional or 2-dimensional configuration for sensing temperature, stress or strain in the PM fiber at different locations along the fiber with a high spatial sensing resolution. In some implementations, the disclosed techniques and devices can be implemented to simultaneously measure stress, strain and temperature from analyzing the probe light. For example, both temperature and stress/strain can be simultaneously measured by using the same sensors to extract and separate temperature measurements from stress/strain measurements.


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