The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2016

Filed:

Dec. 13, 2011
Applicants:

Kiyohito Ishida, Sendai, JP;

Takayuki Akizuki, Hirakata, JP;

Inventors:

Kiyohito Ishida, Sendai, JP;

Takayuki Akizuki, Hirakata, JP;

Assignees:

Nippon Seisen Co., Ltd., Osaka-shi, Osaka, JP;

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C22F 1/08 (2006.01); H01B 1/02 (2006.01); C22C 9/01 (2006.01); F16F 1/02 (2006.01); C22C 9/06 (2006.01);
U.S. Cl.
CPC ...
F16F 1/021 (2013.01); C22C 9/01 (2013.01); C22C 9/06 (2013.01); C22F 1/08 (2013.01); H01B 1/026 (2013.01);
Abstract

A copper alloy wire is a filamentary material of a copper alloy containing, in percent by mass, Ni: 3.0 to 15.0%, Al: 0.5 to 5.0%, and Si: 0.1 to 3.0%, with the remainder being composed of Cu and incidental impurities, which is provided with the tensile strength (σB) of 900 to 1300 MPa and electrical conductivity of 10 to 22% IACS and, in addition to that property, satisfies an intensity ratio of A:B:C of 1.0:1.2 to 6.0:2.2 to 8.0 when A, B and C represent diffraction intensities of Cu (111), Cu (200) and Cu (220), respectively, according to an X-ray diffraction method in a predetermined cross section, and which is used for an operation or contact spring by incorporating in mobile phones and various small electronic instruments by formulating into a copper alloy spring used, particularly, for an electrical conductive spring.


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