The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2016
Filed:
Nov. 30, 2010
Robert M. Harman, Troutville, VA (US);
Philippe Legrand, The Woodlands, TX (US);
Brooks Childers, Christianburg, VA (US);
Roger Duncan, Christianburg, VA (US);
Alan Reynolds, Windsor, VA (US);
Sam Dippold, Christiansburg, VA (US);
Robert M. Harman, Troutville, VA (US);
Philippe Legrand, The Woodlands, TX (US);
Brooks Childers, Christianburg, VA (US);
Roger Duncan, Christianburg, VA (US);
Alan Reynolds, Windsor, VA (US);
Sam Dippold, Christiansburg, VA (US);
BAKER HUGHES INCORPORATED, Houston, TX (US);
Abstract
An apparatus for estimating at least one parameter includes: a deformable member configured to deform in response to the at least one parameter; a housing surrounding at least a portion of an external surface of the deformable member to define an isolated region around the portion and an isolated surface of the deformable member; and at least one optical fiber sensor disposed on the isolated surface and held in an operable relationship with the isolated surface, the at least one optical fiber sensor configured to generate a signal in response to a deformation of the deformable member.