The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2016

Filed:

Oct. 14, 2011
Applicant:

Michael Keil, Ludwigshafen, DE;

Inventor:

Michael Keil, Ludwigshafen, DE;

Assignee:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 31/22 (2006.01); B01L 3/00 (2006.01); A61B 5/15 (2006.01); A61B 5/151 (2006.01); G01N 33/52 (2006.01); A61B 5/157 (2006.01);
U.S. Cl.
CPC ...
B01L 3/5023 (2013.01); A61B 5/1411 (2013.01); A61B 5/1519 (2013.01); A61B 5/150022 (2013.01); A61B 5/150068 (2013.01); A61B 5/150282 (2013.01); A61B 5/150358 (2013.01); A61B 5/150435 (2013.01); A61B 5/150503 (2013.01); B01L 3/502715 (2013.01); A61B 5/157 (2013.01); B01L 2300/0825 (2013.01); Y10T 29/49789 (2015.01); Y10T 29/49798 (2015.01); Y10T 29/49885 (2015.01); Y10T 156/1052 (2015.01);
Abstract

The test strip stabilizes skin prior to incision by a lancet tip. The innovative test strip includes a pair of skin contacting tabs that apply pressure linearly to the skin to stretch the skin taut. Beneficially an incision by a lancet tip to an accurate depth can be formed on the taut skin. Moreover, pressure from the tabs is applied linearly to the skin which results in a higher ratio of pressure to surface that can be reached as compared to applying pressure laminarily to skin. Some manufacturing techniques of the skin contacting tabs include cutting or stamping through all of the layers and test area of the test strip to form these tabs. These techniques increase the manufacturing efficiency and cost savings associated with test strips and integrated lancet testing devices. Contamination from other sampling events is eliminated since the test strips are disposed of after each use.


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