The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2016

Filed:

Oct. 01, 2012
Applicant:

David Feinberg, Sebastapol, CA (US);

Inventor:

David Feinberg, Sebastapol, CA (US);

Assignee:

ADVANCED MRI TECHNOLOGIES LLC, Sebastopol, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/54 (2006.01); A61B 5/026 (2006.01); G01R 33/483 (2006.01); G01R 33/563 (2006.01); A61B 5/00 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0263 (2013.01); G01R 33/4835 (2013.01); G01R 33/543 (2013.01); G01R 33/56366 (2013.01); A61B 5/0042 (2013.01); G01R 33/5616 (2013.01);
Abstract

An MRI scanner and an MRI method that effectively reduce the inherent difference in timing of TE in the SIR images by using alternating polarity of the slice selective gradient pulse Gs and corresponding alternate polarity in RF phase offset in the excitation pulse. By using alternating polarity selective gradients, the refocusing gradient pulse on the Gs axis can be eliminated between the excitation pulses so that the time spacing between the multiple SIR excitation pulses is reduced, and therefore the time delay between onset of slice signal decay is reduced. This results in an earlier possible TE of the first excited slice, hence less signal decay and higher SNR, and overall the TE of different slices can be more nearly the same.


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