The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Apr. 12, 2013
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05B 37/02 (2006.01); H05B 37/03 (2006.01); H05B 33/08 (2006.01); G01J 1/42 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
H05B 37/03 (2013.01); G01J 1/4257 (2013.01); G01M 11/00 (2013.01); H05B 33/089 (2013.01); H05B 33/0851 (2013.01); H05B 37/0218 (2013.01);
Abstract

The present invention relates to a method of detecting a failed luminaire and/or light sensor in a lighting system comprising M luminaires and N light sensors. The elements Dof an N×M transfer matrix D expresses how each luminaire l affect a light sensor s with respect to sensed light intensity, wherein s=1, 2, . . . N, and l=1, 2, . . . , M. The method comprises the steps of: setting the intensity of light emitted by the respective luminaires in the lighting system to a first intensity setting according to the respective elements of a first intensity vector I(), determining a first sensor intensity vector E(), setting the intensity of light emitted by the respective luminaires to at least a second intensity setting according to the respective elements of a second intensity vector I(), wherein at least one element of Idiffers from a corresponding element or elements in determining a second sensor intensity vector E(), determining fault detection vectors from a difference between Eand D·I) and between Eand D·I, respectively (), and identifying a failed luminaire and/or light sensor on basis of a difference between corresponding elements of the respective fault detection vectors (). The present invention further relates to a failure detection system for detecting a failed luminaire and/or light sensor.


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