The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Feb. 08, 2016
Applicant:

Certusview Technologies, Llc, Palm Beach Gardens, FL (US);

Inventors:

Steven Nielsen, North Palm Beach, FL (US);

Curtis Chambers, Palm Beach Gardens, FL (US);

Jeffrey Farr, Royal Palm Beach, FL (US);

David Pennington, Huntsville, AL (US);

Assignee:

CertusView Technologies, LLC, Palm Beach Gardens, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E02D 29/00 (2006.01); H04M 3/42 (2006.01); G06F 17/30 (2006.01); G06F 15/16 (2006.01); G06Q 99/00 (2006.01); F41H 11/00 (2006.01);
U.S. Cl.
CPC ...
H04M 3/42348 (2013.01); E02D 29/00 (2013.01); G06F 15/16 (2013.01); G06F 17/30 (2013.01); F41H 11/00 (2013.01); G06Q 99/00 (2013.01);
Abstract

Methods, apparatus and systems for computer-aided determination of quality assessment for locate and marking operations. In one example, a quality assessment decision is solely under the discretion of a human reviewer, albeit facilitated in some respects by computer-aided display of information, and electronic record keeping and communication functions associated with the quality assessment result(s). In another example, information related to a locate and marking operation is electronically analyzed such that a quality assessment is not based solely on human discretion, but rather based at least in part on some predetermined criteria and/or metrics that facilitate an automated determination of quality assessment.


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