The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2016
Filed:
Feb. 11, 2014
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Yuichiro Fujita, Kyoto, JP;
Shigeki Kajihara, Uji, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
Even when only mass spectra wherein the reproducibility of peak intensities is low are obtained in a mass spectrometry apparatus using, for example, a MALDI ion source, the correction of shifts in retention time using TICs for a plurality of specimens is performed with good precision. For each mass spectrum, variable scaling is executed which combines such first scaling as to equalize the extent of variations in signal intensity values in one mass spectrum, among different mass spectra, and second scaling for performing weighting according to relative variations in signal intensity values for each mass spectrum (S). The signal intensity values after the scaling are added to obtain a total signal intensity value for one measurement time point (S). From a plurality of total signal intensity values thus obtained, a TIC is created (S). Using these TICs, RT alignment is executed (S). Thus, the similarity in TIC waveforms increases, and RT alignment can be suitably performed.