The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Aug. 21, 2014
Applicant:

Hitachi Information & Telecommunication Engineering, Ltd., Yokohama-shi, Kanagawa-ken, JP;

Inventors:

Katsumi Kimura, Kanagawa-ken, JP;

Takumi Nakada, Kanagawa-ken, JP;

Hiroaki Nishihara, Kanagawa-ken, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 5/127 (2006.01); G11B 5/60 (2006.01); G11B 5/00 (2006.01); G11B 5/31 (2006.01);
U.S. Cl.
CPC ...
G11B 5/6088 (2013.01); G11B 5/314 (2013.01); G11B 2005/0021 (2013.01);
Abstract

Provided is a precise alignment method for an optical component that positions a slider to X-axis and Y-axis coordinates of maximal intensity in a manner such that frame images of a laser beam passing through an optical waveguide are captured while relatively moving the slider and a semiconductor laser device at a uniform speed in the X and Y directions, the X-axis coordinate of the maximal intensity is calculated by performing a fitting calculation only in the X direction, frame images of a laser beam passing through the optical waveguide are captured by relatively moving the slider and the semiconductor laser device at a uniform speed only in the Y direction while the X-axis coordinate is fixed, and the Y-axis coordinate of the target maximal intensity is calculated by performing a fitting calculation only in the Y direction.


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