The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Nov. 04, 2014
Applicant:

Infinitum Solutions, Inc., Santa Clara, CA (US);

Inventor:

Juergen Heidmann, Salinas, CA (US);

Assignee:

Infinitum Solutions, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/02 (2006.01); G11B 5/33 (2006.01); G11B 5/455 (2006.01); G01N 24/08 (2006.01); G11B 5/00 (2006.01);
U.S. Cl.
CPC ...
G11B 5/455 (2013.01); G01N 24/08 (2013.01); G11B 2005/0021 (2013.01);
Abstract

A crystal film with one or more nitrogen vacancy centers is placed in close proximity to a recording head. A magnetic field or heat produced by the recording head as well as excitation illumination and an excitation field is applied to the crystal film. The magnetic field produced by the recording head, the heat produced by a thermal device on the recording head, and/or the excitation field may be varied. A confocal microscope or wide-field microscope optically detects a decrease in a spin dependent photoluminescence in response to the magnetic field or heat, excitation field and excitation illumination caused by electron spin resonance (ESR) of the at least one nitrogen vacancy center to measure Optically Detected Spin Resonance (ODMR). A characteristic of the recording head is determined using the ODMR.


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