The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Jun. 17, 2010
Applicants:

James F. Dempsey, Chagrin Falls, OH (US);

Qingguo Zeng, Twinsburg, OH (US);

Roger Nana, Oakwood Village, OH (US);

John L. Patrick, Oakwood Village, OH (US);

Timothy P. Eagan, Oakwood Village, OH (US);

Shmaryu M. Shvartsman, Highland Heights, OH (US);

Inventors:

James F. Dempsey, Chagrin Falls, OH (US);

Qingguo Zeng, Twinsburg, OH (US);

Roger Nana, Oakwood Village, OH (US);

John L. Patrick, Oakwood Village, OH (US);

Timothy P. Eagan, Oakwood Village, OH (US);

Shmaryu M. Shvartsman, Highland Heights, OH (US);

Assignee:

ViewRay Technologies, Inc., Oakwood Village, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01); G01R 33/48 (2006.01); G01R 33/561 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G06T 11/006 (2013.01); G01R 33/4826 (2013.01); G01R 33/5611 (2013.01); G01R 33/5608 (2013.01); G06T 2211/424 (2013.01);
Abstract

Systems and methods for tomographic reconstruction of an image include systems and methods for producing images from k-space data. A k-space data set of an imaged object is acquired using know k-space data acquisition systems and methods. A portion of the k-space data set is sampled so as to collect some portion of the k-space data. An image is then reconstructed from the collected portion of the k-space data set according to a convex optimization model.


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