The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2016
Filed:
Dec. 18, 2013
Leica Microsystems (Schweiz) Ag, Heerbrugg, CH;
Reto Zuest, Diepoldsau, CH;
Meinrad Berchtel, Schnifis, AT;
Leica Microsystems (Schweiz) AG, Heerbrugg, CH;
Abstract
A method for calibrating a microscope apparatus () having a variable optical magnification system () and a detector device () is disclosed. First, a calibrating mode is performed, wherein an image () of an object () is captured at a known reference magnification value, two characteristic reference points () are determined in the image, a reference distance () between the two reference points is determined, and a correlation is determined between the reference distance and the reference magnification value. Later, a measuring mode is implemented, in which a current image () of the object () is captured at a second magnification value, the two characteristic reference points () are identified therein, a current distance () between the current reference points is determined, and the second magnification value is determined from the current distance () based on the correlation between the reference distance () and the reference magnification value.