The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Aug. 13, 2014
Applicant:

Raytheon Bbn Technologies Corp., Cambridge, MA (US);

Inventors:

Manasvi Tickoo, Cambridge, MA (US);

Devansh Arpit, Buffalo, NY (US);

Xiaodan Zhuang, Somerville, MA (US);

Walter Andrews, Sudbury, MA (US);

Pradeep Natarajan, Lexington, MA (US);

Assignee:

RAYTHEON BBN TECHNOLOGIES CORP., Cambridge, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06N 99/00 (2010.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06N 99/005 (2013.01); G06K 9/6235 (2013.01); G06K 2009/6236 (2013.01);
Abstract

A method for feature transformation of a data set includes: receiving a data set including original feature samples with corresponding class labels; splitting the data set into a direction optimization set and a training set; using the direction optimization set to calculate an optimum transformation vector that maximizes inter-class separability and minimizes intra-class variance of the feature samples with respect to corresponding class labels; using the optimum transformation vector to transform the rest of the original feature samples of the data set to new feature samples with enhanced discriminative characteristics; and training a classifier using the new feature samples, wherein the method is performed by one or more processors.


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