The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Apr. 26, 2012
Applicants:

Shohei Hido, Kanagawa-ken, JP;

Michiaki Tatsubori, Tokyo, JP;

Inventors:

Shohei Hido, Kanagawa-ken, JP;

Michiaki Tatsubori, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06N 99/00 (2010.01); G06F 21/55 (2013.01); G06Q 10/10 (2012.01); G06Q 40/08 (2012.01);
U.S. Cl.
CPC ...
G06N 99/005 (2013.01); G06F 21/552 (2013.01); G06Q 10/10 (2013.01); G06Q 40/08 (2013.01);
Abstract

In a case where supervised (learning) data is prepared and the case where test data is prepared, the data is recorded with time information attached to the data. The method includes clustering the learning data in a target class and clustering the test data in the target class. Then, the probability density for each of identified subclasses is calculated for each of time intervals having various time points and widths for the learning data, and is calculated for each of time intervals in the latest time period which have various widths, for the test data. Then, a ratio between a probability density obtained when learning is performed and a probability density obtained when testing is performed is obtained as a relative frequency in each of the time intervals for each of the subclasses. Input having a relative frequency that statistically and markedly increases is detected as an anomaly.


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