The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

May. 09, 2014
Applicant:

Xerox Corporation, Norwalk, CT (US);

Inventors:

Sakyajit Bhattacharya, Bangalore, IN;

Tridib Mukherjee, Bangalore, IN;

Koustuv Dasgupta, Bangalore, IN;

Shruti Kunde, Mumbai, IN;

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06N 5/02 (2006.01); G06N 5/04 (2006.01); H04L 29/08 (2006.01); G06N 99/00 (2010.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06N 99/005 (2013.01); H04L 67/10 (2013.01);
Abstract

Methods and systems for creating one or more statistical classifiers. A first set of performance parameters, corresponding to the one or more applications and the one or more computing infrastructures, is extracted from a historical data pertaining to the execution of the one or more applications on the one or more computing infrastructures. Further, a set of application-specific and a set of infrastructure-specific parameters are selected, from the first set of performance parameters, based on one or more statistical techniques. A similarity between each pair of the applications, each pair of the computing infrastructures, and each pair of possible combinations of an application and a computing infrastructure is determined. One or more statistical classifiers are created, based on the determined similarity.


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