The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Nov. 30, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Hyun Kyu Seo, Austin, TX (US);

Ronald B. Williams, Austin, TX (US);

Gideon Zenz, Kassel, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/00 (2006.01); G06F 21/55 (2013.01); H04L 29/06 (2006.01); G06F 11/34 (2006.01); H04L 12/801 (2013.01);
U.S. Cl.
CPC ...
G06F 21/552 (2013.01); G06F 11/34 (2013.01); H04L 47/29 (2013.01); H04L 63/1425 (2013.01); G06F 2221/034 (2013.01);
Abstract

Software that automatically creates baselines from time series data of computer system activity, thereby providing immediate value from observed system data. The software performs the following operations: (i) receiving values of one or more attributes of a computing system that correspond to one or more time periods; (ii) determining a first set of statistical thresholds for the received values, wherein the received values include a subset of values that exceed the first set of statistical thresholds; (iii) determining a second set of statistical thresholds for the subset of values that exceed the first set of statistical thresholds; and (iv) determining a baseline pattern for the one or more attributes based, at least in part, on the determined first set of statistical thresholds and the determined second set of statistical thresholds.


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