The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Mar. 20, 2014
Applicant:

GE Lighting Solutions, Llc., East Cleveland, OH (US);

Inventors:

Benjamin James Ward, East Cleveland, OH (US);

Mark J Mayer, Sagamore Hills, OH (US);

Koushik Saha, Brunswick, OH (US);

Dengke Cai, Willoughby, OH (US);

Gabriel Michael Smith, Cleveland, OH (US);

Assignee:

GE Lighting Solutions, LLC, East Cleveland, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); F21V 7/00 (2006.01); F21V 7/22 (2006.01); F21Y 101/00 (2016.01);
U.S. Cl.
CPC ...
G06F 17/50 (2013.01); F21V 7/0025 (2013.01); F21V 7/22 (2013.01); F21Y 2101/00 (2013.01);
Abstract

Provided is a method including determining a first incident angle at which light from a light source will impinge on a first thin-film reflective stack of a planned first reflector for a lighting system. The method also includes determining a second incident angle at which light from the light source will impinge on a second thin-film reflective stack of a planned second reflector for the lighting system. The method further includes designing, using a processor executing a software package, the first reflector, comprising tuning a reflective characteristic of the first thin-film reflective stack as a function of the first incident angle determined, and designing, using the processor executing the software package, the second reflector, comprising tuning a reflective characteristic of the second thin-film reflective stack as a function of the second incident angle determined.


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