The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Jan. 03, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Edgar R. Cordero, Round Rock, TX (US);

Anand Haridass, Bagalore, IN;

Girisankar Paulraj, Chennai, IN;

Diyanesh B. Vidyapoornachary, Bangalore, IN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G06F 17/00 (2006.01); H01L 21/66 (2006.01); G01R 31/3185 (2006.01); H01L 25/065 (2006.01);
U.S. Cl.
CPC ...
G06F 17/00 (2013.01); G01R 31/2607 (2013.01); G01R 31/318513 (2013.01); H01L 22/34 (2013.01); H01L 25/0657 (2013.01); H01L 2225/06541 (2013.01); H01L 2924/0002 (2013.01);
Abstract

A computer determines a threshold signal voltage of a semiconductor device. The computer determines a first expected signal propagation time for a signal travelling through a first test path of the semiconductor device. The computer transmits a first signal through the first test path. The computer measures a signal voltage and signal propagation time of the first signal. The computer determines that the signal voltage of the first signal does not reach or exceed the threshold signal voltage within the first expected signal propagation time. The computer determines that the first test path contains a defect.


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