The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Mar. 27, 2014
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Jungwhan Rhee, Princeton, NJ (US);

Hui Zhang, Princeton Junction, NJ (US);

Nipun Arora, Plainsboro, NJ (US);

Guofei Jiang, Princeton, NJ (US);

Qiang Zeng, State College, PA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3466 (2013.01); G06F 2201/865 (2013.01);
Abstract

A computer implemented method for maintaining a program's calling context correct even when a monitoring of the program goes out of a scope of a program analysis by validating function call transitions and recovering partial paths before and after the violation of the program's control flow. The method includes detecting a violation of control flow invariants in the software system including validating a source and destination of a function call in the software system, interpreting a pre-violation partial path responsive to a failure of the validating, and interpreting a post violation path after a violation of program flow.


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