The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2016
Filed:
Jan. 08, 2016
International Business Machines Corporation, Armonk, NY (US);
Joydeep Banerjee, Rancho Palos Verdes, CA (US);
Paul A. Wojciak, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Mechanisms are provided for determining threshold conditions for performing operations within a performance monitoring tool. Metric data is collected from a computing system environment and clustering analysis is performed on the metric data to generate a plurality of clusters. One or more candidate clusters are selected that are candidate clusters for generating a threshold condition for performance monitoring. At least one threshold condition for performance monitoring is generated based on a composition of the selected one or more candidate clusters. The at least one threshold condition is then applied to future performance metric data to determine whether to perform an operation in response to the future performance metric data meeting or not meeting the at least one threshold condition.