The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2016
Filed:
Mar. 16, 2012
Mark S. Farrell, Pleasant Valley, NY (US);
Charles W. Gainey, Jr., Poughkeepsie, NY (US);
Marcel Mitran, Markham, CA;
Chung-lung K. Shum, Wappingers Falls, NY (US);
Brian L. Smith, Kingston, NY (US);
Mark S. Farrell, Pleasant Valley, NY (US);
Charles W. Gainey, Jr., Poughkeepsie, NY (US);
Marcel Mitran, Markham, CA;
Chung-Lung K. Shum, Wappingers Falls, NY (US);
Brian L. Smith, Kingston, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
An aspect includes run-time instrumentation reporting. An instruction stream is executed by a processor. Run-time instrumentation information of the executing instruction stream is captured by the processor. Run-time instrumentation records are created based on the captured run-time instrumentation information. A run-time instrumentation sample point of the executing instruction stream on the processor is detected. A reporting group is stored in a run-time instrumentation program buffer. The storing is based on the detecting and the storing includes: determining a current address of the run-time instrumentation program buffer, the determining based on instruction accessible run-time instrumentation controls; and storing the reporting group into the run-time instrumentation program buffer based on an origin address and the current address of the run-time instrumentation program buffer, the reporting group including the created run-time instrumentation records.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile