The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Jan. 19, 2012
Applicants:

David Roberts Mcmurtry, Dursley, GB;

David Collingwood, Stroud, GB;

Inventors:

David Roberts McMurtry, Dursley, GB;

David Collingwood, Stroud, GB;

Assignee:

RENISHAW PLC, Wotton-under-Edge, Gloucestershire, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/012 (2006.01); G01B 7/012 (2006.01); G05B 19/18 (2006.01); G01B 7/00 (2006.01);
U.S. Cl.
CPC ...
G05B 19/182 (2013.01); G01B 5/012 (2013.01); G01B 7/00 (2013.01); G01B 7/012 (2013.01);
Abstract

An analog probe for a machine tool apparatus, including a probe body and a stylus member movably secured to the probe body in a suspended rest position via a suspension mechanism. A sensor is provided for measuring the extent of displacement of the stylus member relative to the probe body from a rest position. The analog probe further includes a first compliant sealing member extending between the probe body and stylus member such that the sensor is contained within a chamber sealed from external contaminants. The analog probe also has for a suppressor for suppressing movement of the stylus member away from its suspended rest position induced by changes in the chamber's internal pressure and/or changes in the analog probe's operating environment.


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