The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Feb. 28, 2013
Applicant:

Abb Technology Ag, Zurich, CH;

Inventors:

Mario Hoernicke, Landau, DE;

Rainer Drath, Weinheim, DE;

Ben Schroeter, Heidelberg, DE;

Kurt Langer, Walldorf, DE;

Jarkko Lalu, Espoo, FI;

Assignee:

ABB Schweiz AG, Baden, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 9/02 (2006.01); G05B 17/02 (2006.01); G05B 19/042 (2006.01); G05B 19/05 (2006.01);
U.S. Cl.
CPC ...
G05B 9/02 (2013.01); G05B 17/02 (2013.01); G05B 19/0426 (2013.01); G05B 19/056 (2013.01); G05B 2219/13037 (2013.01); G05B 2219/13142 (2013.01); G05B 2219/23283 (2013.01); G05B 2219/33297 (2013.01);
Abstract

An exemplary method and a system for debugging a control system of an industrial plant where the system includes at least two different control sub-systems, of the same or different control equipment type, on plant or sub-system level, and has specific programmable controller units in devices like PLCs, DCSs, robots, drives, instruments and/or other process specific components whereas all specified parameters and signals of the control system across its sub-systems, devices, and technologies are extracted and visualized on a single sight and are utilized for the definition of system wide breakpoints, utilizing a subset of those signals or parameters, and related conditions, e.g. logical combinations of the signals or parameters.


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