The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2016
Filed:
Feb. 16, 2016
Applicants:
E-vision Smart Optics, Inc., Sarasota, FL (US);
Kent State University, Kent, OH (US);
Inventors:
Liwei Li, Tempe, AZ (US);
Anthony Van Heugten, Sarasota, FL (US);
Dwight Duston, Laguna Niguel, CA (US);
Phil Bos, Hudson, OH (US);
Douglas Bryant, Aurora, OH (US);
Assignees:
e-Vision Smart Optics, Inc., Sarasota, FL (US);
Kent State University, Kent, OH (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/133 (2006.01); G02F 1/1343 (2006.01); G02F 1/1333 (2006.01); G02B 27/22 (2006.01); G02F 1/29 (2006.01);
U.S. Cl.
CPC ...
G02F 1/134309 (2013.01); G02B 27/22 (2013.01); G02F 1/13439 (2013.01); G02F 1/133345 (2013.01); G02F 1/29 (2013.01); G02F 2001/294 (2013.01);
Abstract
Certain exemplary embodiments can provide a system, machine, apparatus, device, manufacture, circuit, composition of matter, and/or user interface adapted for and/or resulting from, and/or a process, method, and/or machine-readable medium comprising machine-implementable instructions for, activities that can comprise and/or relate to, generating a gradient in an index of refraction of a material.