The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2016
Filed:
Mar. 16, 2012
Applicants:
Birol Akdemir, Gaertringen, DE;
Onur Keles, Boeblingen, DE;
Inventors:
Birol Akdemir, Gaertringen, DE;
Onur Keles, Boeblingen, DE;
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/319 (2006.01); G01R 31/3183 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31917 (2013.01); G01R 31/318371 (2013.01);
Abstract
A method of wafer-level testing of a register programmable integrated circuit may be provided. The method may comprise transforming a microcode instruction and related data from an initializing processor format into tester format data, and applying the tester format data to the integrated circuit on a wafer.